US Patent Issued to Taiwan Semiconductor Manufacturing on March 31 for "Semiconductor device tester" (Taiwanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,006, issued on March 31, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsin-Chu, Taiwan).

"Semiconductor device tester" was invented by Ting-Yu Chiu (Hsinchu County, Taiwan), Yi-Neng Chang (Hsinchu County, Taiwan), Shin-Han You (Taoyuan City, Taiwan) and Chien Fang Huang (Hsinchu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system and method of testing are provided. In some embodiments, a system for testing an integrated circuit package includes a device tester. The device tester includes a socket, a cylinder head unit engageable with the socket, and a pressure regulator. The socket includes a first pressure c...