US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on March 31 for "Integrated circuit testing system and method" (Taiwanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,003, issued on March 31, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Integrated circuit testing system and method" was invented by Chewn-Pu Jou (Hsinchu, Taiwan) and Min-Jer Wang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing an integrated circuit includes connecting a conductive line to a ground voltage. The method further includes directly physically contacting the conductive line with a first conductive structure. The method further includes contacting the conductive line with a second conductive structure different from the first conductive structure. The method furthe...