US Patent Issued to Taiwan Semiconductor Manufacturing on June 30 for "System and method for diagnosing design rule check violations" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,310, issued on June 30, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"System and method for diagnosing design rule check violations" was invented by Yu-Chen Huang (Hsinchu, Taiwan), Heng-Yi Lin (Hsinchu, Taiwan) and Yi-Lin Chuang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for fixing DRC violations includes receiving a layout pattern having a design rule check (DRC) violation therein, determining that the layout pattern is an inlier based upon a comparison of the layout pattern with a plurality of previously analyzed layout patterns. The comparison may be performed by an anoma...