US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on June 30 for "Semiconductor device and method of testing the same" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,672,522, issued on June 30, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Semiconductor device and method of testing the same" was invented by Ruei-Jyun Hsu (Hsinchu City, Taiwan), Wei Wang (Taipei City, Taiwan), Wei-Jen Chang (Miaoli County, Taiwan), Chung-Shi Chiang (Hsinchu County, Taiwan), Chia-Chi Ho (Hsinchu County, Taiwan), Hsin-Shan Liu (Changhua County, Taiwan) and Chang-Hung Yu (Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a semiconductor device. The semiconductor device includes: a substrate including a transistor, wherein the semiconductor device is s...