ALEXANDRIA, Va., July 7 -- United States Patent no. 12,677,634, issued on July 7, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Wafer notch positioning detection" was invented by Kai-An Chuang (Miaoli, Taiwan), Kuang-Wei Hsueh (Zhubei City, Taiwan), Shih-Huan Chen (Zhubei City, Taiwan) and Yung-Shu Kao (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical system may include a light source to provide a beam of light. The optical system may include a reflector to receive and redirect the beam of light. The optical system may include a light gate having an opening to permit the beam of light, from the reflector, to travel through the opening. The optical sy...