US Patent Issued to Taiwan Semiconductor Manufacturing on July 14 for "Clock generation circuits for memory devices with built-in self test" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,972, issued on July 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Clock generation circuits for memory devices with built-in self test" was invented by Jui-Che Tsai (Hsinchu, Taiwan), Chia-En Huang (Hsinchu, Taiwan), Tung-Cheng Chang (Hsinchu, Taiwan), Chun-Ying Lee (Hsinchu, Taiwan) and Yih Wang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit includes one or more functional circuits, and a clock generation circuit operatively coupled to the one or more functional circuits. The clock generation circuit is configured to: receive a control signal to switch the one or more functional circu...