ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,720,801, issued on Aug. 25, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).
"Transistor structure with low resistance contact" was invented by Ming-Heng Tsai (Taipei, Taiwan), Chih-Hao Chang (Hsinchu, Taiwan), Chun-Sheng Liang (Hsin-Chu, Taiwan) and Ta-Chun Lin (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Semiconductor structures and processes are provided. A semiconductor structure of the present disclosure includes a first base portion and a second base portion extending lengthwise along a first direction, a first source/drain feature disposed over the first base portion, a second source/drain feat...