ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,720,834, issued on Aug. 25, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan) and NATIONAL TAIWAN UNIVERSITY (Taipei, Taiwan).

"Integrated circuit structure and method for forming the same" was invented by Shih-Yen Lin (New Taipei City, Taiwan) and Che-Jia Chang (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes performing a first deposition process to form a first graphene layer over a substrate, the first deposition process being performed under a first temperature and a first pressure; performing a second deposition process to form a second graphene layer over the first graphene lay...