US Patent Issued to Synopsys on Sept. 1 for "Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support" (American, Italian Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,065, issued on Sept. 1, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support" was invented by Adam D. Cron (Hilton Head Island, S.C.), Tomer Y. Morad (New York) and Salvatore Talluto (Gavirate, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first profile associated with a first circuit may be obtained by running a first test (which may be a shmoo test) on the first circuit. Running the first test on the first circuit may include: selecting an operating condition for testing the first circuit, where the operating condition includes noi...