US Patent Issued to Synopsys on May 12 for "Automatic test pattern generation to increase coverage in detecting defects in analog circuits" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,043, issued on May 12, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Automatic test pattern generation to increase coverage in detecting defects in analog circuits" was invented by Peilin Jiang (Santa Clara, Calif.) and Mayukh Bhattacharya (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Test patterns are generated to test for a specified defect in an analog circuit by applying a succession of different strategies. Each strategy efficiently determines nominal responses and defect responses of the analog circuit to trial test patterns. The nominal response is a response of the analog circuit without the specified defect, and the...