ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,102, issued on July 21, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Thread data race detection and synchronization for parallel implementation of verification testbenches" was invented by Dawei Pan (Hopkinton, Mass.) and Vivek Gaur (Shrewsbury, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testbench for a design under test (DUT) includes components used to verify functionality of the DUT through simulation of the DUT. The components are grouped into component groups, and the components within an individual component group are executed on a same thread of the simulation. The component groups are also executed on a single thread, whic...