ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,525, issued on Nov. 3, was assigned to SUTENG INNOVATION TECHNOLOGY Co. LTD. (Shenzhen, China).
"Time-of-flight measurement method, apparatus, and system" was invented by Jincheng Yang (Shenzhen, China) and Yalin Ren (Shenzhen, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "This application discloses a time-of-flight measurement method, apparatus, and system. The method includes obtaining histogram data of a target object. The histogram data includes m counts, m is an integer greater than 1, and each of the m counts is associated with a time. The method also includes performing digital filtering on the m counts to obtain m filtered values respe...