US Patent Issued to SUMITOMO ELECTRIC INDUSTRIES on July 28 for "Testing device, testing method, and non-transitory storage medium storing testing program" (Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,313, issued on July 28, was assigned to SUMITOMO ELECTRIC INDUSTRIES LTD. (Osaka, Japan).

"Testing device, testing method, and non-transitory storage medium storing testing program" was invented by Kosuke Fujii (Osaka, Japan) and Koichi Koyama (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing device includes a contactless measurement unit configured to measure a thickness of a test object and a probe needle configured to move by a distance in accordance with the thickness measured by the measurement unit to come into contact with an electrode of the test object."

The patent was filed on Oct. 25, 2023, under Application No. 1...