ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,697,664, issued on Aug. 4, was assigned to SUMITOMO ELECTRIC INDUSTRIES LTD. (Osaka, Japan).
"Analysis device, analysis method, machining system, and program" was invented by Akihiro Toyoshima (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis device according to the present disclosure analyzes the state of a machining tool. The analysis device includes: an acquisition unit that acquires a measurement result from at least one sensor fitted to the machining tool; a computation unit that performs data processing to the measurement result acquired by the acquisition unit; and an image processing unit that displays a first image and a s...