US Patent Issued to STMicroelectronics International on June 30 for "Architecture for testing multiple scan chains" (Italian Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,541, issued on June 30, was assigned to STMicroelectronics International N.V. (Geneva).

"Architecture for testing multiple scan chains" was invented by Enea Dimroci (Borgo San Dalmazzo, Italy), Roberta Priolo (Milan) and Francesco Battini (Milan).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to an embodiment, a test system for serially testing of finite state machine circuits using scan chains is proposed. Each scan chain is coupled to a finite state machine circuit to test the finite state machine circuit coupled thereto. Each scan chain has a number of input terminals and one output terminal. The test system includes a dispatcher input i...