US Patent Issued to STMicroelectronics International on June 2 for "Integrated circuit comprising a test circuit, related method and computer-program product" (Italian Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,927, issued on June 2, was assigned to STMicroelectronics International N.V. (Geneva).

"Integrated circuit comprising a test circuit, related method and computer-program product" was invented by Gianluca Tortora (Legnano, Italy) and Mario Barone (Gorgonzola, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a sequential logic circuit and a circuit configured to change operation as a function of state output signals provided by state flip-flops of the sequential logic circuit. With a test mode signal asserted, a test circuit writes and reads the content of the state flip-flops in order to test the operation of the seq...