US Patent Issued to STAR TECHNOLOGIES on May 12 for "Probe device, probe system including the probe device and operating method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,164, issued on May 12, was assigned to STAR TECHNOLOGIES INC. (Hsinchu City, Taiwan).

"Probe device, probe system including the probe device and operating method thereof" was invented by Choon Leong Lou (Hsinchu City, Taiwan), Ho-Yeh Chen (Hsinchu City, Taiwan), Hsiao-Hui Hsieh (Hsinchu City, Taiwan) and Dai-Chun Chen (Hsinchu City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a probe device, a probe system including the probe device and an operating thereof. The operating method includes: approaching the probe device to a reference region; stopping the probe device when a first pin of a sensing module of the ...