US Patent Issued to STANLEY ELECTRIC on Nov. 3 for "Abnormality detection apparatus, abnormality detection method, and program" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,715, issued on Nov. 3, was assigned to STANLEY ELECTRIC Co. LTD. (Tokyo).

"Abnormality detection apparatus, abnormality detection method, and program" was invented by Kenji Suina (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection apparatus, which detects abnormality of a resonant sensor signal output from a sensor unit of an optical deflector, includes: a resonant sensor signal processing unit including a function of A/D-converting the resonant sensor signal output from the sensor unit into resonant sensor signal data, and a function of outputting a data acquisition completion and the A/D-converted resonant sensor signal d...