US Patent Issued to Spec-Imaging on July 14 for "Grating for optical measurements, an assembly for measurements of one or more optical parameters of a medium and a method of using the assembly" (Swedish Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,948, issued on July 14, was assigned to Spec-Imaging AB (Lund, Sweden).

"Grating for optical measurements, an assembly for measurements of one or more optical parameters of a medium and a method of using the assembly" was invented by Edouard Jean Jacques Berrocal (Lund, Sweden).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure relates to a grating for optical measurements comprising: a base plate extending in a plane in two spatial directions; a plural number q of periodic patterns, each with a surface and space periodic wave optical mask and each with a different interval frequency; wherein the periodic patterns are arranged adjacent eac...