US Patent Issued to Snowflake on Aug. 11 for "Built-in data quality monitoring" (Washington, California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,218, issued on Aug. 11, was assigned to Snowflake Inc. (Bozeman, Mont.).

"Built-in data quality monitoring" was invented by Hossein Ahmadi (Seattle), Raja Suresh Krishna Balakrishnan (Fremont, Calif.), David Schultz (Piedmont, Calif.), Jian Xu (San Jose, Calif.) and Yunqiao Zhang (Bellevue, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Described herein are techniques for data quality monitoring in a network-based data system. A data metric function used to evaluate data quality can be stored, where the data metric function is defined as schema level object. The data metric function can be attached to a table associated with an account and is ...