ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,783,913, issued on Nov. 3, was assigned to Snap Inc. (Santa Monica, Calif.).
"Thermal runtime prediction for electronic devices" was invented by Tejas Bahulkar (Sunnyvale, Calif.), Dunxu Hu (Venice, Calif.), Yizhou Ma (Los Angeles), Jonah Hephzibah Okike (Los Angeles), John James Robertson (Los Angeles), Kai Zhou (Wiener Neudorf, Austria) and Richard Zhuang (San Diego).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for predicting remaining thermal runtime in an electronic device is disclosed. The method involves obtaining the device's current processor power consumption and temperature sensor reading, selecting a predefined function re...