ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,496, issued on March 17, was assigned to SmartAuger Inc. (Wadsworth, Ohio).
"B-scan normalization for non-destructive testing" was invented by Nathan Stein (Seattle).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method can include receiving, from a non-destructive testing (NDT) scanner, a plurality of A-Scans of a length of a scanned region, generating a raw B-Scan of the scanned region using the plurality of A-Scans, receiving, from a position sensor coupled to the NDT scanner, a plurality of distance measurements of the NDT scanner along the length of the scanned region, matching each of the plurality of A-Scans with a distance measurement of t...