ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,481, issued on June 16, was assigned to SmartAuger Inc. (Wadsworth, Ohio).
"B-Scan slicing for non-destructive testing" was invented by Nathan Stein (Seattle).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method can include receiving a B-Scan image for a scanned region generated using a non-destructive testing (NDT) scanner, determining a sub-image window based upon a physical distance scale associated with the scanned region, determining a stride distance based upon a dimension of interest of the scanned region, overlapping the sub-image window with a first portion of the B-Scan image to define a first B-Scan sub-image, sliding the sub-image wind...