US Patent Issued to SK hynix on Nov. 3 for "Semiconductor apparatus having test function and semiconductor system including the same" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,861, issued on Nov. 3, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Semiconductor apparatus having test function and semiconductor system including the same" was invented by Hyun Seung Kim (Icheon-si, South Korea) and Hyeong Soo Jeong (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor apparatus includes a data alignment circuit and a data pattern control circuit. The data alignment circuit aligns data input through each of a plurality of data input/output pads to generate a plurality of alignment data. The data pattern control circuit generates a plurality of preliminary write data by copying some bits ...