US Patent Issued to SK hynix on July 21 for "Semiconductor device that detects connection defects between word lines and bit lines and test method for the same" (South Korean Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,901, issued on July 21, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Semiconductor device that detects connection defects between word lines and bit lines and test method for the same" was invented by Tae Sik Yun (Icheon-si Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a control circuit configured to deactivate a word line during an active operation during a test mode, generate a matching control signal and a sense amplifier drive signal, and activate the word line after a settling period during the test mode, and a sense amplifier configured to drive a bit line and an inverted bi...