US Patent Issued to SK hynix on Aug. 11 for "Methods and apparatus for performing a deep-erase verification operation" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,162, issued on Aug. 11, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Methods and apparatus for performing a deep-erase verification operation" was invented by Sung Hyun Hwang (Icheon-si, South Korea) and Jae Yeop Jung (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a memory cell array and a peripheral circuit. The memory cell array is coupled to a plurality of word lines and a plurality of bit lines. The peripheral circuit performs a deep-erase verification operation to determine whether a target memory cell has a threshold voltage that is lower than a first negative reference voltag...