US Patent Issued to SK HYNIX, SK HYNIX NAND PRODUCT SOLUTIONS on March 3 for "Error condition monitoring in memory systems" (Canadian, American Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,478, issued on March 3, was assigned to SK HYNIX INC. (South Korea) and SK HYNIX NAND PRODUCT SOLUTIONS CORP. (Rancho Cordova, Calif.).

"Error condition monitoring in memory systems" was invented by Pengfei Huang (San Jose, Calif.), Zion Kwok (Burnaby, Canada) and Fan Zhang (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "This application is directed to data validation in an electronic device having a memory device. The memory device receives an inquiry for a validity condition of a page of the memory device from a memory controller that is coupled to the memory device in a memory system. In response to the inquiry, the memory device...