US Patent Issued to Sintokogio on Aug. 25 for "Abnormality determination device and abnormality determination method for an additive manufacturing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,552, issued on Aug. 25, was assigned to Sintokogio Ltd. (Nagoya, Japan).

"Abnormality determination device and abnormality determination method for an additive manufacturing apparatus" was invented by Kazuya Kojima (Nagoya, Japan) and Norihiro Asano (Nagoya, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality determination device for an additive manufacturing apparatus for building a part having three-dimensional shape by repeatedly forming a membrane of raw material and forming a cured layer having two-dimensional shape, the membrane formed by a blade in a build area, the raw material including ceramic particles and photocurable res...