ALEXANDRIA, Va., May 26 -- United States Patent no. 12,637,786, issued on May 26, was assigned to SILTRONIC AG (Munich).

"Method for producing a gallium oxide layer on a substrate" was invented by Walter Haeckl (Kirchweidach, Germany), Ta-Shun Chou (Berlin) and Andreas Popp (Eichwalde, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A Beta-Ga2O3 layer is grown on a substrate by: performing a first deposition cycle at a first growth rate using oxygen and a precursor including Ga, the first deposition cycle having a thickness of at least 3 atomic layers of Beta-Ga2O3 and at most 20 atomic layers of Beta-Ga2O3; determining a regression curve for a layer surface reflectivity using tuples of a measured fir...