US Patent Issued to SILICONWARE PRECISION INDUSTRIES on July 21 for "Test base cleaning line and method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,686,039, issued on July 21, was assigned to SILICONWARE PRECISION INDUSTRIES Co. LTD. (Taichung City, Taiwan).

"Test base cleaning line and method thereof" was invented by Hsiang-Yun Hung (Taichung City, Taiwan), Yi-Ren Chen (Taichung City, Taiwan), Chun-Yu Hsieh (Taichung City, Taiwan) and Ping-Lin Chang (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test base cleaning line and a method thereof are provided. The test base cleaning line includes a plurality of cleaning mechanisms, a scanning device, and a moving device. The scanning device is configured for scanning a barcode on a test base to identify a type of the test base, a...