US Patent Issued to Signature IP on Aug. 4 for "Flexible test instruction set architecture" (American, Philippine, Indian Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,131, issued on Aug. 4, was assigned to Signature IP Corp. (Milpitas, Calif.).

"Flexible test instruction set architecture" was invented by Shivam Mehra (New Delhi), Parag Bhatt (San Jose, Calif.), Michael Loe Fernandez (Quezon City, Philippines), Kishore Mishra (Santa Clara, Calif.) and Purna Mohanty (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for the testing of devices are disclosed. A testing environment is accessed. The testing environment includes an instruction RAM, an instruction fetch and decode unit (FAD), a code exerciser, a command interface, and a trace RAM. A device under test (DUT) is accessible by the co...