US Patent Issued to Siemens Shanghai Medical Equipment on March 31 for "Predicting scattered signal of x-ray, and correcting scattered beam" (Chinese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,592,015, issued on March 31, was assigned to Siemens Shanghai Medical Equipment Ltd. (Shanghai).

"Predicting scattered signal of x-ray, and correcting scattered beam" was invented by Yang Wang (Shanghai), Rui Kang Zhang (Shanghai), Kai Chen (Shanghai) and Yi Tian (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for predicting a scattered signal of an X-ray for an examination object includes: scanning each phantom in a scanning manner in which a scattering degree of each phantom in a plurality of phantoms is less than a reference scattering degree, so as to obtain first projection data of each phantom; scanning each phantom in a scannin...