US Patent Issued to Siemens on Oct. 27 for "Machine learning model for automatically detecting faults using optical inspection" (German Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,020, issued on Oct. 27, was assigned to Siemens AG (Munich).

"Machine learning model for automatically detecting faults using optical inspection" was invented by Thomas Decker (UnterschleiBheim, Germany) and Michael Lebacher (Toging am Inn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method for generating a trained machine learning model for automatically detecting faults in a manufactured product using optical inspection is provided, including receiving a multitude of image data of images taken from manufactured products to be inspected, establishing a segmentation machine learning model which inputs the image data...