US Patent Issued to Siemens Industry Software on July 28 for "Contour extraction of images with selection-based auto tuning" (American, Belgian Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,503, issued on July 28, was assigned to Siemens Industry Software Inc. (Plano, Texas).

"Contour extraction of images with selection-based auto tuning" was invented by Germain Louis Fenger (Gladstone, Ore.), Hsin-Wei Wu (Heverlee, Belgium) and Kiarash Ahi (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computing system can obtain wafer images of integrated circuitry having physical structures and classify each of the wafer images based on image characteristics of the wafer images. The computing system can partition each of the wafer images into a plurality of blocks, analyze each of the blocks to determine which of the blocks corre...