ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,751,684, issued on Oct. 6, was assigned to SIEMENS HEALTHINEERS AG (Forchheim, Germany).
"Providing adjusted recording parameters" was invented by Benjamin Schweikert (Gutenstetten, Germany) and Bjoern Kreisler (Hausen, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method comprises: capturing spatially resolved dose profiles for an x-ray imaging scan of at least one examination object in accordance with initial recording parameters via a photon-counting x-ray detector, wherein each photon-counting detector element provides a dose value depending on a number of detected x-ray photons after an interaction between x-ray radia...