ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,110, issued on Oct. 27, was assigned to Siemens Healthineers AG (Forchheim, Germany).

"Spectrally resolved X-ray imaging" was invented by Thomas Allmendinger (Forchheim, Germany), Markus Juergens (Adelsdorf, Germany), Alexander Ziegler (Eggolsheim, Germany) and Patrick Wohlfahrt (Erlangen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray system for acquiring projection measurement data of an examination object comprises: an X-ray emitter arrangement having an X-ray radiation source to emit X-rays; and a photon-counting X-ray detector with at least one detection threshold for spectrally resolved detection of the X-rays. The at least on...