ALEXANDRIA, Va., June 2 -- United States Patent no. 12,646,607, issued on June 2, was assigned to Siemens Healthineers AG (Forchheim, Germany).
"Self-supervised learning for interventional image analysis" was invented by Dominik Neumann (Erlangen, Germany), Saahil Islam (Erlangen, Germany), Venkatesh Narasimha Murthy (Hillsborough, N.J.), Serkan Cimen (West Orange, N.J.), Florin-Cristian Ghesu (Baiersdorf, Germany), Puneet Sharma (Princeton Junction, N.J.) and Dorin Comaniciu (Princeton, N.J.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for performing one or more medical imaging analysis tasks are provided. A sequence of medical images is received. One or more patches are extracted from...