ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,576, issued on Aug. 11, was assigned to Siemens Healthineers AG (Forchheim, Germany).
"EPI data correction method and device and MRI system" was invented by Kun Zhou (Shenzhen, China), Wei Liu (Erlangen, Germany) and Yulin Chang (Belmont, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Echo planar imaging scanning techniques are provided. In a single excited EPI scanning process, a 90deg RF excited pulse is applied to a target tissue. Then, a first RF convergence pulse is applied, followed by a first readout gradient pulse sequence in a readout direction while forbidding phase encoding gradients in a phase encoding direction and simultaneously ...