US Patent Issued to Siemens Healthcare Diagnostics on March 17 for "Methods and apparatus for automated specimen characterization using diagnostic analysis system with continuous performance based training" (New Jersey Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,432, issued on March 17, was assigned to Siemens Healthcare Diagnostics Inc. (Tarrytown, N.Y.).

"Methods and apparatus for automated specimen characterization using diagnostic analysis system with continuous performance based training" was invented by Venkatesh NarasimhaMurthy (Hillsborough, N.J.), Vivek Singh (Princeton, N.J.), Yao-Jen Chang (Princeton, N.J.), Benjamin S. Pollack (Jersey City, N.J.), Ankur Kapoor (Plainsboro, N.J.) and Rayal Raj Prasad Nalam Venkat (Princeton, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of characterizing a specimen to be analyzed in an automated diagnostic analysis system provides a segmentation d...