US Patent Issued to SHM SYSTEM SPOLKA Z O.O. SPOLKA KOMANDYTOWA on Jan. 20 for "Method and detector for identifying a moment of plastic deformation of material" (Polish Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,558, issued on Jan. 20, was assigned to SHM SYSTEM SPOLKA Z O.O. SPOLKA KOMANDYTOWA (Cracow, Poland).

"Method and detector for identifying a moment of plastic deformation of material" was invented by Lukasz Bednarski (Kielce, Poland) and Rafal Marek Sienko (Cracow, Poland).

According to the abstract* released by the U.S. Patent & Trademark Office: "Method for identifying a plastic deformation of material of an object in situ using strain sensors operating on the principle of electrical resistive strain gauging, fibre optic measurements using fibre Bragg gratings (FBG), vibrating wire sensors VW, distributed fibre optic sensors (DFOS), inductive, capacitive, or piezoresistive sens...