US Patent Issued to SHIN-ETSU CHEMICAL on Aug. 25 for "Quality evaluation method, manufacturing system of silicon for evaluation, manufacturing method of silicon for evaluation, and silicon for evaluation" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,884, issued on Aug. 25, was assigned to SHIN-ETSU CHEMICAL Co. LTD. (Tokyo).

"Quality evaluation method, manufacturing system of silicon for evaluation, manufacturing method of silicon for evaluation, and silicon for evaluation" was invented by Naruhiro Hoshino (Niigata, Japan), Shigetoshi Yamagishi (Niigata, Japan), Atsushi Yoshida (Niigata, Japan) and Masahiko Ishida (Niigata, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A quality evaluation method has a step of producing a silicon for evaluation in which a single crystal silicon is grown to extend radially from a core wire 9 while polycrystalline silicon is grown in a reactor 20; and a st...