ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,961, issued on March 31, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Monitoring device and monitoring system" was invented by Tohru Matsuura (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A monitoring device is a monitoring device of a material testing machine including a display having a marker on a display panel. The monitoring device includes: an acquisition unit that acquires a photographed image of a camera that photographs the display panel; a first generation unit that generates a first processed image obtained by gray-scaling the photographed image; a second generation unit that generates a second processed image obtained ...