US Patent Issued to SHIMADZU on June 23 for "Defect detection device and defect detection method" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,258, issued on June 23, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Defect detection device and defect detection method" was invented by Tomotaka Nagashima (Kyoto, Japan), Takahide Hatahori (Kyoto, Japan) and Kenji Takubo (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a defect detection device (10), an exciter (11) gives a test object (S) a vibration with a variable frequency. A vibration state measurer (15, 163) performs a measurement of the vibration state of the surface of the test object by an optical means while the vibration is given to the test object, and determines, for each position on the surface, a numerical value re...