US Patent Issued to SHIMADZU on July 28 for "X-ray fluorescence analyzer" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,247, issued on July 28, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"X-ray fluorescence analyzer" was invented by Yuji Morihisa (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The X-ray fluorescence analyzer is equipped with a sample stage, a first housing, an X-ray tube, a detector, and a vacuum adjustment mechanism. The sample stage is configured to place a sample thereon. The first housing is mounted on a first face of the sample stage, the sample being placed on the first face, the first housing forming a sample chamber together with the sample stage. The detector is configured to detect fluorescent X-rays emitted from the sample...