US Patent Issued to SHIMADZU on July 28 for "Data analysis apparatus, data analysis method, method of generating trained model, system, and program" (Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,273, issued on July 28, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Data analysis apparatus, data analysis method, method of generating trained model, system, and program" was invented by Haodong Qiu (Kyoto, Japan) and Shiori Nagai (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A data analysis apparatus, a data analysis method, a method of generating a trained model, a system, and a program that allow highly accurate and easy analysis of an FT-IR spectrum are provided. The data analysis apparatus includes an obtaining unit that obtains an analysis target which is an FT-IR spectrum, a trained model, and an analyzer that inputs the a...