US Patent Issued to SHIMADZU on July 21 for "X-ray fluorescence spectrometer" (Japanese Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,508, issued on July 21, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"X-ray fluorescence spectrometer" was invented by Keijiro Suzuki (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray fluorescence spectrometer includes: a sample stage; an X-ray tube that radiates excitation X-rays toward the sample stage; a detector that detects fluorescent X-rays emitted from a sample on the sample stage; and a control device that controls the X-ray tube and the detector. Assuming that an intensity of X-rays that are part of the fluorescent X-rays, of a material of an X-ray tube target, emitted from the X-ray tube and are Rayleigh scattered by...