ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,991, issued on July 14, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Waveform-analyzing method, waveform-analyzing device and analyzing system" was invented by Shinji Kanazawa (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a method for analyzing a signal waveform which is a chromatogram or spectrum, including: a model creation step for creating a trained model for locating a peak portion in an input waveform, by machine learning using a plurality of sets of reference waveforms in each of which the position of the peak portion is known; a region estimation step (S11-S14) for dividing an analysis-target waveform into parti...