US Patent Issued to SHENZHEN METALENX TECHNOLOGY on July 21 for "MTF detection device for wafer-level optical element" (Chinese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,455, issued on July 21, was assigned to SHENZHEN METALENX TECHNOLOGY Co. LTD (Shenzhen, China).

"MTF detection device for wafer-level optical element" was invented by Chengliang Lai (Shenzhen, China), Chenglong Hao (Shenzhen, China), Fengze Tan (Shenzhen, China) and Jian Zhu (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A MTF detection device for wafer-lever optical elements is provided, the MTF detection device including a luminescent source, a mobile disc, an adjustable bracket, and a detection assembly. A plurality of luminescent sources are movable along the direction of the light path. The mobile disc is set up with a placing ...