US Patent Issued to SHENZHEN KUKI ELECTRONIC on May 19 for "Wireless high-temperature probe with time-multiplexed NTC leads and manufacturing method thereof" (Chinese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,496, issued on May 19, was assigned to SHENZHEN KUKI ELECTRONIC Co. LTD. (Shenzhen, China).

"Wireless high-temperature probe with time-multiplexed NTC leads and manufacturing method thereof" was invented by Rongyuan Zhu (Shenzhen, China), Guo Qu (Shenzhen, China) and Weihua Xiu (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A wireless high-temperature probe with time-multiplexed NTC leads and a manufacturing method thereof include a probe tube assembly, a ceramic insulating ring and a coaxial coupling shaft which are successively connected. The probe tube assembly is internally provided with a PCBA, the PCBA is integrated with leads ...