US Patent Issued to Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences on Nov. 3 for "Instant nucleic acid test method and test kit for pathogenic mutants" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,781,287, issued on Nov. 3, was assigned to Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences (Shenzhen, China).

"Instant nucleic acid test method and test kit for pathogenic mutants" was invented by Wei Zhao (Shenzhen, China), Guiyue Tang (Shenzhen, China), Wei Tan (Shenzhen, China) and Guoping Zhao (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure discloses an instant nucleic acid detection method and detection kit for detecting pathogenic mutants, belongs to the technical field of biological detection, includes the following steps: Step 1): collecting samples, and extracting sample nucleic acids...